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revisions ltr description date (yr-mo-da) approved a changes in accordance with nor 5962-r076-92. 91-11-26 ray monnin b redrawn with changes. add devices 05 through 09. add vendor cage number 6y440 to device types 01 through 04, n package only, device types 05 through 09 x,y,t, u and n. add vendor cage number 04713 to device types 02,03, and 04, x package only. add vendor cage number 65786 to device types 03 through 06 packages x, y, u, n, and m, and to device types 07 and 08, packages y, u, n, and m. add vendor cage number 61772 to devices 05 and 06, packages x, y, m, n and u. add vendor cage number 0k6n4 to device types 03 through 08 packages y,u,n, and m. remove vendor cage numbers 0bk02 and 0byv4 from the drawing. editorial changes throughout. 93-0217 m. a. frye c changes in accordance with nor 5962-r098-95 95-04-14 m. a. frye d boilerplate update, part of 5 year review. ksr 07-10-02 robert m. heber the original first page of this drawing has been replaced. rev sheet rev sheet rev status rev d d d d d d d d d d d d d d of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 12 13 14 pmic n/a prepared by kenneth s. rice defense supply center columbus standard microcircuit drawing checked by ray monnin columbus, ohio 43218-3990 http://www.d scc.dla.mil this drawing is available for use by all departments approved by michael a. frye and agencies of the department of defense drawing approval date 88-09-27 microcircuit, memory, digital, cmos, 32k x 8 static ram (sram), monolithic silicon amsc n/a revision level d size a cage code 67268 5962-88662 sheet 1 of 14 dscc form 2233 apr 97 5962-e598-07 .
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing describes device requirements for mil- std-883 compliant, non-jan class level b microcircuits in accordance with mil-prf-38535, appendix a. 1.2 part or identifying number (pin) . the complete pin is as shown in the following example: 5962-88662 01 x_ a drawing number device type (see 1.2.1) case outline (see 1.2.2) lead finish (see 1.2.3) 1.2.1 device type(s) . the device type(s) identify the circuit function as follows: device type generic number 1 / circuit function access time 01 32k x 8 cmos sram 100 ns 02 70 ns 03 55 ns 04 45 ns 05 35 ns 06 25 ns 07 20 ns 08 15 ns 09 12 ns 1.2.2 case outline(s) . the case outline(s) are as des ignated in mil-std-1835 and as follows: outline letter descriptive designator terminals package style x gdip1-t28 or cdip2-t28 28 dual in-line y cqcc1-n32 32 rectangular leadless chip carrier z cdfp3-f28 28 flat pack u cqcc3-n28 28 rectangular leadless chip carrier t cdfp4-f28 28 flat pack n cdip3-t28 or gdip4-t28 28 dual in-line m gdfp2-f28 28 flat pack 1.2.3 lead finish . the lead finish is as spec ified in mil-prf-38535, appendix a. 1.3 absolute maximum ratings . supply voltage range (v cc ) --------------------------------------- -0.5 v dc to +7.0 v dc 2 / input voltage range ------------------------------------------------- -0.5 v dc to +6.0 v dc ambient storage tem perature ------------------------------------ -65 c to +150 c thermal resistance, junction-to-case ( jc ) ------------------ see mil-std-1835 junction temperature (t j ) ----------------------------------------- +150 c 3 / power dissipati on --------------------------------------------------- 1.0 w lead temperature (solderi ng, 10 seconds)-------------------- +260 c 1.4 recommended operating conditions . supply voltage range (v cc ) -------------------------------------- 4.5 v dc to 5.5 v dc 2 / ground voltage (v ss ) ---------------------------------------------- 0 v dc input high voltage range (v ih ) ----------------------------------- 2.2 v dc to v cc +0.5 v dc input low voltage range (v il ) ------------------------------------- -0.5 v dc to 0.8 v dc operating case temperature (t c ) ------------------------------- -55 c to +125 c 1 / generic numbers are listed on the standard microcircuit drawing source a pproval bulletin and will also be listed in mil-hdbk-103. 2 / all voltages referenced to v ss . 3 / maximum junction temperature shall not be exceeded except for allowable short duration burn-in screening conditions in accordance with method 5004 of mil-std-883.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 3 dscc form 2234 apr 97 2. applicable documents 2.1 government specif ication, standards, and handbooks . the following specificati on, standards, and handbooks form a part of this drawing to the extent specified herein. unless otherwise specified, the issues of thes e documents are those cited in t he solicitation or contract. department of defense specification mil-prf-38535 - integrated circuits, manufacturing, general specification for. department of defense standards mil-std-883 - test me thod standard microcircuits. mil-std-1835 - interface standard electronic component case outlines. department of defense handbooks mil-hdbk-103 - list of st andard microcircuit drawings. mil-hdbk-780 - standard microcircuit drawings. (copies of these document s are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the standardization document order desk, 700 robbins avenue, building 4d, philadelphia, pa 19111-5094.) 2.2 order of precedence . in the event of a conflict between the text of this drawing and the refe rences cited herei n, the text of this drawing takes precedence. nothing in this document, how ever, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. requirements 3.1 item requirements . the individual item requirements shall be in accordance with mil-prf-38535, appendix a for non- jan class level b devices and as specified herein. product built to this drawing t hat is produced by a q ualified manufacturer listing (qml) certified and qualif ied manufacturer or a manufacturer who has been granted transitional cert ification to mil-prf - 38535 may be processed as qml product in accordance with t he manufacturers approved program plan and qualifying activity approval in accordance with mil-prf-38535. this qml flow as documented in the qualit y management (qm) plan may make modifications to the requirements herein. these modifications shall not affect form, fit, or function of the device. these modifications shall not affect the pin as described herein. a "q" or "qml" certific ation mark in accordance with mil-prf-38535 is required to identify when t he qml flow option is used. 3.2 design, construction, and physical dimensions . the design, construction, and physica l dimensions shall be as specified in mil-prf-38535, appendix a and herein. 3.2.1 terminal connections . the terminal connections shall be as specified on figure 1. 3.2.2 truth table . the truth table shall be as specified on figure 2. 3.2.3 case outlines . the case outlines shall be in accordance with 1.2.2 herein. 3.2.4 die overcoat . polyimide and silicone coatings are allowable as an overcoat on the die for al pha particle protection only. each coated microcircuit inspection lot (see inspection lot as defined in mil-prf-38535) sha ll be subjected to and pass the internal moisture content test at 5000 ppm (see method 1018 of mil-std-883). t he frequency of the internal water vapor testing shall not be decreased unless approved by the preparing activity for class m. the trb will ascertain the requirements as provided by mil-prf-38535 for classes q and v. samples may be pulled any time after seal. 3.3 electrical performance characteristics . unless otherwise specified herein, the electrical performance characteristics are as specified in table i and shall apply over the full case operati ng temperature range. 3.4 electrical test requirements . the electrical test requirements shall be the subgroups specified in table ii. the electrical tests for each subgroup are described in table i.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 4 dscc form 2234 apr 97 table i. electrical performance characteristics . conditions test symbol -55 c t c +125 c group a device limits unit v ss = 0 v, subgroups types 4.5 v v cc 5.5 v min max unless otherwise specified input leakage current i li v cc = maximum 1,2,3 all 10 a v in = gnd to v cc output leakage i lo v cc = maximum a current v out = gnd to v cc 1,2,3 all 10 ce v ih , we v il output low voltage v ol v cc = 4.5 v, i ol = 8 ma 1,2,3 all 0.4 v v il = 0.8 v, v ih = 2.2 v output high voltage v oh v cc = 4.5 v, i oh = -4 ma 1,2,3 all 2.4 v v il = 0.8 v, v ih = 2.2 v operating supply i cc1 v cc = 5.5 v, f = f max 1 / 1,2,3 01,02 105 ma current ce = v il , outputs open 03-05 150 all other inputs at v il 06 160 07 170 08 180 09 190 01-06 35 standby power supply i cc2 ce v ih , outputs open 1,2,3 07 40 ma current (ttl) v cc = 5.5 v 08 50 09 60 standby power supply i cc3 ce (v cc -0.2 v), f = 0 mhz 1,2,3 all 20 ma current (cmos) outputs open, v cc = 5.5 v all other inputs 0.2 v or (v cc -0.2 v) input capacitance c i 2 / v i = 5.0 v or gnd 4 all 11 pf f = 1 mhz, t c = +25 c see 4.3.1c output capacitance c o 2 / v o = 5.0 v or gnd 4 all 11 pf f = 1 mhz, t c = +25 c see 4.3.1c see footnotes at end of table.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 5 dscc form 2234 apr 97 table i. electrical performance characteristics - continued. conditions test symbol -55 c t c +125 c group a device limits unit v ss = 0 v, 3 / subgroups types 4.5 v v cc 5.5 v min max unless otherwise specified read cycle time t avav 9,10,11 01 100 ns 02 70 03 55 04 45 05 35 06 25 07 20 08 15 09 12 address access time t avqv 9,10,11 01 100 ns 02 70 03 55 04 45 05 35 06 25 07 20 08 15 09 12 chip-enable access t elqv 9,10,11 01 100 ns time 02 70 03 55 04 45 05 35 06 25 07 20 08 15 09 12 see footnotes at end of table.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 6 dscc form 2234 apr 97 table i. electrical performance characteristics - continued. conditions test symbol -55 c t c +125 c group a device limits unit v ss = 0 v, 3 / subgroups types 4.5 v v cc 5.5 v min max unless otherwise specified output hold from t avqx 9,10,11 01-08 3 ns address change 09 2 output enable to t olqv 9,10,11 01 60 ns output valid 5 / 02,03 35 04, 05 20 06 15 07 10 08 8 09 6 chip select to output t elqx 9,10,11 01-08 3 ns in low z 2 / 4 / 09 2 chip deselect to t ehqz 9,10,11 01-03, 05 35 ns output in high z 5 / 2 / 4 / 04 20 06 15 07,08 10 09 7 output disable to t ohqz 9,10,11 01-03, 05 35 ns output in high z 5 / 2 / 4 / 04 20 06 15 07,08 10 09 7 write enable to output t wlqz 9,10,11 01 50 ns in high z 5 / 2 / 4 / 02,03,05 35 04 20 06 15 07,08 10 09 7 01-04, output enable to t olqx 9,10,11 06-09 0 ns output in low z 2 / 4 / 05 2 data valid to end of t dvwh 9,10,11 01-03 35 ns write 5 / t dveh 04,05 20 06 15 07,08 10 09 8 see footnotes at end of table.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 7 dscc form 2234 apr 97 table i. electrical performance characteristics - continued. conditions test symbol -55 c t c +125 c group a device limits unit v ss = 0 v, 3 / subgroups types 4.5 v v cc 5.5 v min max unless otherwise specified data hold time t whdx 9,10,11 01-04 3 ns t ehdx 05-09 0 output active from t whqx 9,10,11 01-06 3 ns end of write 2 / 4 / 07-09 0 write cycle time t avav 9,10,11 01 100 ns 02 70 03 55 04 45 05 35 06 25 07 20 08 15 09 12 chip select to end t elwh 9,10,11 01 90 ns of write 02 60 03 50 04 40 05 30 06 20 07 15 08 12 09 10 see footnotes at end of table.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 8 dscc form 2234 apr 97 table i. electrical performance characteristics - continued. conditions test symbol -55 c t c +125 c group a device limits unit v ss = 0 v, 3 / subgroups types 4.5 v v cc 5.5 v min max unless otherwise specified address valid to end t avwh 9,10,11 01 85 ns of write 02 60 03 50 04 40 05 30 06 20 07 15 08 12 09 10 address-setup time t avwl 9,10,11 all 0 ns write pulse width t wlwh 9,10,11 01 55 ns 02 45 03 40 04 35 05 30 06 20 07 15 08 12 09 10 write recovery time t whax 9,10,11 01-08 0 ns t ehax 09 2 1 / f max = 1/t avav (minimum) 2 / this parameter tested initially and after any design or proc ess change which could affect th is parameter, and therefore shal l be guaranteed to the limits specified in table i. 3 / for load circuits see figure 3 and for timing waveforms see figure 4. 4 / transition is measured 500 mv from steady-state voltage. 5 / this parameter has been tightened for devic e type 04. any date code product prior to the date of revision c of this drawing may not meet this limit. see revision b for the electric al parameter value that app lies to prior date code product.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 9 dscc form 2234 apr 97 device types all case outlines x, z, u, t, n, and m y terminal number terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 a 14 a 12 a 7 a 6 a 5 a 4 a 3 a 2 a 1 a 0 i/o 1 i/o 2 i/o 3 gnd i/o 4 i/o 5 i/o 6 i/o 7 i/o 8 ce a 10 oe a 11 a 9 a 8 a 13 we v cc --- --- --- --- nc a 14 a 12 a 7 a 6 a 5 a 4 a 3 a 2 a 1 a 0 nc i/o 1 i/o 2 i/o 3 gnd nc i/o 4 i/o 5 i/o 6 i/o 7 i/o 8 ce a 10 oe nc a 11 a 9 a 8 a 13 we v cc figure 1. terminal connections .
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 10 dscc form 2234 apr 97 ce we oe i/o function h v cc -0.2 v l l l x x h h l x x h l x high z high z high z data out data in standby (i cc2 ) standby (i cc3 ) output disable read write figure 2. truth tables (unprogrammed) . output load (for t olqx, t elqx, t ohqz, t wlqz, t ehqz, t whqx ) note: including scope and jig (minimum values). ac testing conditions input pulse levels gnd to 3.0 v input rise and fall times 5 ns input timing reference levels 1.5 v output reference levels 1.5 v figure 3. output load circuit .
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 11 dscc form 2234 apr 97 timing waveform of read cycle no. 1 (1) timing waveform of read cycle no. 2 (1, 2, 4) timing waveform of read cycle no. 3 (1, 3, 4) notes: 1. we is high for read cycle. 2. device is continuously selected. ce = v il . 3. address valid prior to or coincident with ce transition low. 4. oe = v il . 5. transition is measured 500 mv from steady state with 5 pf load (including scope and jig). figure 4. timing waveforms .
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 12 dscc form 2234 apr 97 notes: 1. we must be high during all address transitions. 2. a write occurs during the overlap (t elwh or t wlwh ) of a low ce and a low we . 3. t whax is measured from the earlier of ce or we going high to the end of the write cycle. 4. during this period, the i/o pins are in the output state, and input signals must not be applied. 5. if the ce low transition occurs simultaneously with or after the we low transition, the out puts remain in the high impedance state. 6. transition is measured 500 mv from steady state with a 5 pf load (including scope and jig). 7. if oe is low during a we controlled write cycle, the write pul se width must be the larger of t wlwh or (t wlqz + t dvwh ) to allow the i/o drivers to turn off and data to be placed on the bus for required t dvwh . if oe is low during a we controlled write cycle, this require ment does not apply and the write pulse can be as short as the specified t wlwh . figure 4. timing waveforms - continued.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 13 dscc form 2234 apr 97 table ii. electrical test requirements . 1 / 2 / 3 / mil-std-883 test requirements subgroups (per method 5005, table i) interim electrical parameters (method 5004) --- final electrical test parameters (method 5004) 1*, 2, 3, 7*, 8a, 8b, 9, 10,11 group a test requirements (method 5005) 1,2,3,4**,7,8a,8b, 9, 10,11 groups c and d end-point electrical parameters (method 5005) 2, 3, 7, 8a, 8b 1 / * indicates pda applies to subgroups 1 and 7. 2 / ** see 4.3.1c. 3 / see 4.3.1d. 3.5 marking . marking shall be in accordance with mil-prf-38535, appendix a. the part shall be marked with the pin listed in 1.2 herein. in addition, the manufactu rer's pin may also be marked. for pack ages where marking of the entire smd pin number is not feasible due to space limit ations, the manufacturer has the option of not marki ng the "5962-" on the device. 3.5.1 certificat ion/compliance mark . a compliance indicator ?c? shall be marked on all non-jan devices built in compliance to mil-prf-38535, appendix a. the compliance indicator ?c? sha ll be replaced with a "q" or "q ml" certification mark in accordance with mil-prf-38535 to identif y when the qml flow option is used. 3.6 certificate of compliance . a certificate of compliance shall be required from a manufactu rer in order to be listed as an approved source of supply in mil-hdbk-103 (s ee 6.6 herein). the certificate of co mpliance submitted to dscc-va prior to listing as an approved source of supply sha ll affirm that the manufacturer's product meets the requirement s of mil-prf-38535, appendix a and the requirements herein. 3.7 certificate of conformance . a certificate of conformance as requi red in mil-prf-38535, appendix a shall be provided with each lot of microcircuits delivered to this drawing. 3.8 notification of change . notification of change to dscc-va shall be requi red for any change that affects this drawing. 3.9 verification and review . dscc, dscc's agent, and the acquiring activity re tain the option to review the manufacturer's facility and applicable required doc umentation. offshore documentat ion shall be made available ons hore at the option of the reviewer. 4. verification 4.1 sampling and inspection . sampling and inspection procedures sha ll be in accordance with mil-prf-38535, appendix a. 4.2 screening . screening shall be in accordance with method 5004 of mil-std-883, and shall be conducted on all devices prior to quality conformance inspection. the following additional criteria shall apply: a. burn-in test, method 1015 of mil-std-883. (1) test condition c or d. the test circuit shall be main tained by the manufacturer under document revision level control and shall be made available to the preparing activity upon reques t. the test circuit shall specify the i nputs, outputs, biases, and power dissipation, as applicabl e, in accordance with the intent s pecified in method 1015 of mil-std-883.
standard microcircuit drawing size a 5962-88662 defense supply center columbus columbus, ohio 43218-3990 revision level d sheet 14 dscc form 2234 apr 97 (2) t a = +125 c, minimum. b. interim and final electrical test paramet ers shall be as specified in table ii herei n, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 quality conf ormance inspection . quality conformance inspection shall be in accordance with method 5005 of mil-std- 883 including groups a, b, c, and d inspections. the following additional criteria shall apply. 4.3.1 group a inspection . a. tests shall be as spec ified in table ii herein. b. subgroups 5 and 6 in table i, method 5005 of mil-std-883 s hall be omitted. c. subgroup 4 (c in and c out measurement) shall be measured only for the initial test and after process or design changes which may affect capacitance. sample size is fifteen dev ices with no failures and all input and output terminals tested. c. subgroups 7 and 8 tests sufficient to verify the truth table. 4.3.2 groups c and d inspections . a. end-point electrical parameters shall be as spec ified in table ii herein. b. steady-state life test condi tions, method 1005 of mil-std-883. (1) test condition c or d. the test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to t he preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissi pation, as applicable, in accordance with the intent specified in method 1005 of mil- std-883. (2) t a = +125 c, minimum. (3) test duration: 1,000 hour s, except as permitted by method 1005 of mil-std-883. 5. packaging 5.1 packaging requirements . the requirements for packaging shall be in accordance with mil-prf-38535, appendix a. 6. notes 6.1 intended use . microcircuits conforming to this drawing are int ended for use for government microcircuit applications (original equipment), design applic ations, and logistics purposes. 6.2 replaceability . microcircuits covered by this drawing will repl ace the same generic device covered by a contractor- prepared specificati on or drawing. 6.3 configuration control of smd's . all proposed changes to existing smd's will be coordinated with the users of record for the individual documents. this c oordination will be accomplished using dd form 1692, engineering change proposal. 6.4 record of users . military and industrial users shall inform defens e supply center columbus (dscc) when a system application requires configurati on control and the applicable smd. dscc will main tain a record of users and this list will be used for coordination and distribution of c hanges to the drawings. users of drawi ngs covering microelectronics devices (fsc 5962) should contact dscc- va, telephone (614) 692-0544. 6.5 comments . comments on this drawing should be directed to dscc-va, columbus, ohio 43218-3990, or telephone (614) 692-0547. 6.6 approved sources of supply . approved sources of supply are listed in mil-hdbk-103. the vendors listed in mil-hdbk- 103 have agreed to this drawing and a certif icate of compliance (see 3.6 herein) has been submitted to and accepted by dscc- va.
standard microcircuit drawing bulletin date: 07-10-02 approved sources of supply for smd 5962-88662 are listed below for immediate acquisition information only and shall be added to mil-hdbk-103 and qml-38535 during the next re vision. mil-hdbk-103 and qml-38535 will be revised to include the addition or deletion of s ources. the vendors listed below have agr eed to this drawing and a certificate of compliance has been submitted to and a ccepted by dscc-va. this information bulletin is superseded by the next dated revision of mil-hdbk-103 and qml- 38535. dscc maintains an online databas e of all current sources of supply at http://www.d scc.dla.mil/programs/smcr/ . standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8866201xa 61772 3dtt2 0eu86 0c7v7 3 / 3 / idt71256s100db p4c1256-100dwmb mt5c2568cw-100883c qp7c198-100dmb 6206-100/bxajc edh8832c-10dmhr 5962-8866201ya 61772 3dtt2 0eu86 0c7v7 3 / 3 / idt71256s100l32b p4c1256-100l32mb mt5c2568ecw-100883c qp7c198-100lmb 6206-100m/buajc edh8832c-10dmhr 5962-8866201za 3 / 3 / idt71256s100eb ow62256cz3-10 5962-8866201ua 3dtt2 0eu86 0c7v7 3 / 3 / p4c1256-100l28mb mt5c2568ec-100883c qp7c199-100lmb idt71256s100l28b edi8834c100l28b 5962-8866201ta 3dtt2 0eu86 0c7v7 3 / p4c1256-100fsmb mt5c2568f-100883c qp7c199-100fmb edi8834c100fb 5962-8866201na 61772 3dtt2 0eu86 0c7v7 60264 3 / idt71256s100tdb p4c1256-100dmb mt5c2568c-70883c qp7c199-100dmb ms132k8c100cn edi8834c100qb 5962-8866201nc 3dtt2 p4c1256-100cmb 5962-8866201ma 3dtt2 0c7v7 3 / p4c1256-100fmb qp7c199-100kmb idt71256s100xeb 5962-8866202xa 61772 3dtt2 0eu86 0c7v7 3 / 3 / idt71256s70db p4c1256-70dwmb mt5c2568cw-70883c qp7c198-70dmb 6206-70/bxajc edi8834c70cb see footnotes at end of table. page 1 of 8
standard microcircuit drawi ng bulletin ? continued. standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8866202ya 61772 3dtt2 0eu86 0c7v7 3 / 3 / idt71256s70l32b p4c1256-70l32mb mt5c2568ecw-70883c qp7c198-70lmb 6206-70m/buajc edi8834c70lb 5962-8866202za 3 / 3 / idt71256s70eb ow62256cz3-70 5962-8866202ua 3dtt2 0eu86 0c7v7 3 / 3 / p4c1256-70l28mb mt5c2568ec-70883c qp7c199-70lmb idt71256s70l28b edi8834c70l28b 5962-8866202ta 3dtt2 0eu86 0c7v7 3 / p4c1256-70fsmb mt5c2568f-70883c qp7c199-70fmb edi8834c70fb 5962-8866202na 61772 3dtt2 0c7v7 60264 0eu86 3 / idt71256s70tdb p4c1256-70dmb qp7c199-70dmb ms132k8c70cn mt5c2568c-70883c edi8834c70qb 5962-8866202nc 3dtt2 p4c1256-70cmb 5962-8866202ma 3dtt2 0c7v7 3 / p4c1256-70fmb qp7c199-70kmb idt71256s70xeb 5962-8866203xa 61772 3dtt2 0eu86 0c7v7 3 / 3 / 3 / idt71256s55db p4c1256-55dwmb mt5c2568cw-55883c qp7c198-55dmb 6206-55/bxajc edi8834c55cb l7c199hmb55 5962-8866203ya 61772 3dtt2 0eu86 0c7v7 3 / 3 / 3 / 3 / idt71256s55l32b p4c1256-55l32mb mt5c2568ecw-55883c qp7c198-55lmb 6206-55m/buajc edi8834c55lb l7c199tmb55 pdm41256s55l32b 5962-8866203za 3 / 3 / idt71256s55eb ow62256cz3-55 see footnotes at end of table. page 2 of 8
standard microcircuit drawi ng bulletin ? continued. standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8866203ua 3dtt2 0eu86 0c7v7 3 / 3 / 3 / 3 / 3 / p4c1256-55l28mb mt5c2568ec-55883c qp7c199-55lmb idt71256s55l28b edi8834c55l28b idt71256s55l28b pdm41256s55l28b l7c199kmb55 5962-8866203ta 3dtt2 0eu86 0c7v7 3 / 3 / p4c1256-55fsmb mt5c2568f-55883c qp7c199-55fmb edi8833c55fb l7c199fmb55 5962-8866203na 61772 3dtt2 0c7v7 60264 0eu86 3 / 3/ 3/ idt71256s55tdb p4c1256-55dmb qp7c199-55dmb ms132k8c55cn mt5c2568c-55883c edi8834c55qb l7c199dmb55 pdm41256s55db 5962-8866203nc 3dtt2 p4c1256-55cmb 5962-8866203ma 3dtt2 0c7v7 3 / 3 / p4c1256-55fmb qp7c199-55kmb idt71256s55xeb pdm41256s55eb 5962-8866204xa 61772 0c7v7 0eu86 3dtt2 3 / 3 / 3 / idt71256s45db qp7c198-45dmb mt5c2568cw-45883c p4c1256-45dwmb 6206-45/bxajc l7c199hmb45 edi8834c45cb 5962-8866204ya 61772 3dtt2 0eu86 0c7v7 3 / 3 / 3 / 3 / idt71256s45l32b p4c1256-45l32mb mt5c2568ecw-45883c qp7c198-45lmb 6206-45m/buajc edi8834c45lb l7c199tmb45 pdm41256s45l32b 5962-8866204za 3 / 3 / idt71256s45eb ow62256cz3-45 see footnotes at end of table. page 3 of 8
standard microcircuit drawi ng bulletin ? continued. standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8866204ua 3dtt2 0eu86 0c7v7 3 / 3 / 3 / 3 / p4c1256-45l28mb mt5c2568ec-45883c qp7c199-45lmb idt71256s45l28b edi8834c45l28b pdm41256s45l28b l7c199kmb-45 5962-8866204ta 3dtt2 0eu86 0c7v7 3 / 3 / p4c1256-45fsmb mt5c2568f-45883c qp7c199-45fmb edi8833c45fb l7c199fmb-45 5962-8866204na 61772 3dtt2 0c7v7 60264 0eu86 3 / 3 / 3 / idt71256s45tdb p4c1256-45dmb qp7c199-45dmb ms132k8c45cn mt5c2568c-45883c edi8834c45qb pdm41256s45db l7c199dmb-45 5962-8866204nc 3dtt2 p4c1256-45cmb 5962-8866204ma 3dtt2 0c7v7 3 / 3 / 3 / p4c1256-45fmb qp7c199-45kmb idt71256s45xeb pdm41256s55eb l7c199fmb45 5962-8866205xa 61772 3dtt2 0eu86 0c7v7 3 / idt71256s35db p4c1256-35dwmb mt5c2568cw-35883c qp7c198-35dmb l7c199hmb35 5962-8866205ya 61772 3dtt2 0eu86 0c7v7 3 / 3 / idt71256s35l32b p4c1256-35l32mb mt5c2568ecw-35883c qp7c198-35lmb l7c199tmb35 pdm41256s35l32b 5962-8866205ua 3dtt2 0eu86 0c7v7 3 / 3 / 3 / p4c1256-35l28mb mt5c2568ec-35883c qp7c199-35lmb idt71256s35l28b pdm41256s35l28b l7c199kmb35 see footnotes at end of table. page 4 of 8
standard microcircuit drawi ng bulletin ? continued. standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8866205ta 3dtt2 0eu86 0c7v7 3 / p4c1256-35fsmb mt5c2568f-35883c qp7c199-35fmb l7c199fmb35 5962-8866205na 61772 3dtt2 0c7v7 60264 0eu86 3 / 3 / idt71256s35tdb p4c1256-35dmb qp7c199-35dmb ms132k8c35cn mt5c2568c-35883c pdm41256s35db l7c199fmb35 5962-8866205nc 3dtt2 p4c1256-35cmb 5962-8866205ma 3dtt2 0c7v7 3 / 3 / p4c1256-35fmb qp7c199-35kmb idt71256s35xeb pdm41256s35eb 5962-8866206xa 61772 3dtt2 0eu86 0c7v7 3 / idt71256s25db p4c1256-25dwmb mt5c2568cw-25883c qp7c198-25dmb l7c199hmb25 5962-8866206ya 61772 3dtt2 0eu86 0c7v7 3 / 3 / idt71256s25l32b p4c1256-25l32mb mt5c2568ecw-25883c qp7c198-25lmb l7c199tmb25 pdm41256s25l32b 5962-8866206ua 3dtt2 0eu86 0c7v7 3 / 3 / 3 / p4c1256-25l28mb mt5c2568ec-25883c qp7c199-25lmb idt71256s25l28b pdm41256s25l28b l7c199kmb25 5962-8866206ta 3dtt2 0eu86 0c7v7 3 / p4c1256-25fsmb mt5c2568f-25883c qp7c199-25fmb l7c199fmb25 5962-8866206na 61772 3dtt2 0c7v7 60264 0eu86 3 / 3 / idt71256s25tdb p4c1256-25dmb qp7c199-25dmb ms132k8c25cn mt5c2568c-25883c pdm41256s25db l7c199fmb25 see footnotes at end of table. page 5 of 8
standard microcircuit drawi ng bulletin ? continued. standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8866206nc 3dtt2 p4c1256-25cmb 5962-8866206ma 3dtt2 0c7v7 3 / 3 / p4c1256-25fmb qp7c199-25kmb idt71256s25xeb pdm41256s25eb 5962-8866207xa 61772 3dtt2 0eu86 0c7v7 idt71256s20db p4c1256-20dwmb mt5c2568cw-20883c qp7c198-20dmb 5962-8866207ya 61772 3dtt2 0eu86 0c7v7 3 / idt71256s20l32b p4c1256-20l32mb mt5c2568ecw-20883c qp7c198-20lmb pdm41256s20l32b 5962-8866207ua 3dtt2 0eu86 0c7v7 3 / p4c1256-20l28mb mt5c2568ec-20883c qp7c199-20lmb pdm41256s20l28b 5962-8866207ta 3dtt2 0eu86 0c7v7 p4c1256-20fsmb mt5c2568f-20883c qp7c199-20fmb 5962-8866207na 3dtt2 0c7v7 60264 0eu86 3 / p4c1256-20dmb qp7c199-20dmb ms132k8c20cn mt5c2568c-20883c pdm41256s20db 5962-8866207nc 3dtt2 p4c1256-20cmb 5962-8866207ma 3dtt2 0c7v7 3 / p4c1256-20fmb qp7c199-20kmb pdm41256s20eb 5962-8866208xa 3dtt2 0eu86 0c7v7 p4c1256-15dwmb mt5c2568cw-15883c qp7c198-15dmb 5962-8866208ya 3dtt2 0eu86 0c7v7 3 / p4c1256-15l32mb mt5c2568ecw-15883c qp7c198-15lmb pdm41256s15l32b 5962-8866208ua 3dtt2 0eu86 0c7v7 3 / p4c1256-15l28mb mt5c2568ec-15883c qp7c199-15lmb pdm41256s15l28b see footnotes at end of table. page 6 of 8
standard microcircuit drawi ng bulletin ? continued. standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962-8866208ta 3dtt2 0eu86 0c7v7 p4c1256-15fsmb mt5c2568f-15883c qp7c199-15fmb 5962-8866208na 3dtt2 0c7v7 60264 0eu86 3 / p4c1256-15dmb qp7c199-15dmb ms132k8c15cn mt5c2568c-15883c pdm41256s15db 5962-8866208ma 3dtt2 0c7v7 3 / p4c1256-15fmb qp7c199-15kmb pdm41256s15eb 5962-8866209xa 3dtt2 0eu86 0c7v7 p4c1256-12dwmb mt5c2568cw-12883c qp7c198-12dmb 5962-8866209ya 3dtt2 0eu86 0c7v7 p4c1256-12l32mb mt5c2568ecw-12883c qp7c198-12lmb 5962-8866209ua 3dtt2 0eu86 0c7v7 p4c1256-12l28mb mt5c2568ec-12883c qp7c199-12lmb 5962-8866209ta 3dtt2 0eu86 0c7v7 p4c1256-12fsmb mt5c2568f-12883c qp7c199-12fmb 5962-8866209na 3dtt2 0c7v7 60264 0eu86 p4c1256-12dmb qp7c199-12dmb ms132k8c12cn mt5c2568c-12883c 5962-8866209ma 3dtt2 0c7v7 p4c1256-12fmb qp7c199-12kmb 1 / the lead finish shown for each pin representing a hermetic package is the most readily available from the manufacturer listed for that part. if the desired lead finish is not listed, contact the vendor to determine its availability. 2 / caution: do not use this number for item acquisition. items acquired to this number may not satisfy the performance requirements of this drawing. 3 / not available from an approved source. page 7 of 8
vendor cage vendor name number and address 61772 integrated device technology, inc. 6024 silver creek valley road san jose, ca 95138 0c7v7 qp semiconductor 2945 oakmead village court santa clara, ca 95051 0eu86 austin semiconductor inc. 8701 cross park dr. austin, tx 78754-4566 3dtt2 pyramid semiconductor corporation 1340 bordeaux drive sunnyvale, ca 94089 60264 minco technology labs, inc. 1805 rutherford lane austin, tx 78754-5101 the information contained herein is di sseminated for convenience only and the government assumes no liability whats oever for any inaccuracies in the information bulletin. page 8 of 8

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